Найти книгу: "Reliability and Risk"

We all like to know how reliable and how risky certain situations are, and our increasing reliance on technology has led to the need for more precise assessments than ever before. Such precision has resulted in efforts both to sharpen the notions of risk and reliability, and to quantify them. Quantification is required for normative decision-making, especially decisions pertaining to our safety and wellbeing. Increasingly in recent years Bayesian methods have become key to such quantifications. Reliability and Risk provides a comprehensive overview of the mathematical and statistical aspects of risk and reliability analysis, from a Bayesian perspective. This book sets out to change the way in which we think about reliability and survival analysis by casting them in the broader context of decision-making. This is achieved by: Providing a broad coverage of the diverse aspects of reliability, including: multivariate failure models, dynamic reliability, event history analysis, non-parametric Bayes, competing risks, co-operative and competing systems, and signature analysis. Covering the essentials of Bayesian statistics and exchangeability, enabling readers who are unfamiliar with Bayesian inference to benefit from the book. Introducing the notion of “composite reliability”, or the collective reliability of a population of items. Discussing the relationship between notions of reliability and survival analysis and econometrics and financial risk. Reliability and Risk can most profitably be used by practitioners and research workers in reliability and survivability as a source of information, reference, and open problems. It can also form the basis of a graduate level course in reliability and risk analysis for students in statistics, biostatistics, engineering (industrial, nuclear, systems), operations research, and other mathematically oriented scientists, wherein the instructor could supplement the material with examples and problems.

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews “Semiconductor L

This book presents fundamentals of reliability engineering with its applications in evaluating reliability of multistage interconnection networks. In the first part of the book, it introduces the concept of reliability engineering, elements of probability theory, probability distributions, availability and data analysis. The second part of the book provides an overview of parallel/distributed computing, network design considerations, and more. The book covers a comprehensive reliability engineering methods and its practical aspects in the interconnection network systems. Students, engineers, researchers, managers will find this book as a valuable reference source.

Focuses on the core systems engineering tasks of writing, managing, and tracking requirements for reliability, maintainability, and supportability that are most likely to satisfy customers and lead to success for suppliers This book helps systems engineers lead the development of systems and services whose reliability, maintainability, and supportability meet and exceed the expectations of their customers and promote success and profit for their suppliers. This book is organized into three major parts: reliability, maintainability, and supportability engineering. Within each part, there is material on requirements development, quantitative modelling, statistical analysis, and best practices in each of these areas. Heavy emphasis is placed on correct use of language. The author discusses the use of various sustainability engineering methods and techniques in crafting requirements that are focused on the customers’ needs, unambiguous, easily understood by the requirements’ stakeholders, and verifiable. Part of each major division of the book is devoted to statistical analyses needed to determine when requirements are being met by systems operating in customer environments. To further support systems engineers in writing, analyzing, and interpreting sustainability requirements, this book also Contains “Language Tips” to help systems engineers learn the different languages spoken by specialists and non-specialists in the sustainability disciplines Provides exercises in each chapter, allowing the reader to try out some of the ideas and procedures presented in the chapter Delivers end-of-chapter summaries of the current reliability, maintainability, and supportability engineering best practices for systems engineers Reliability, Maintainability, and Supportability is a reference for systems engineers and graduate students hoping to learn how to effectively determine and develop appropriate requirements so that designers may fulfil the intent of the customer.

System reliability, availability and robustness are often not well understood by system architects, engineers and developers. They often don't understand what drives customer's availability expectations, how to frame verifiable availability/robustness requirements, how to manage and budget availability/robustness, how to methodically architect and design systems that meet robustness requirements, and so on. The book takes a very pragmatic approach of framing reliability and robustness as a functional aspect of a system so that architects, designers, developers and testers can address it as a concrete, functional attribute of a system, rather than an abstract, non-functional notion.

A comprehensively updated and reorganized new edition. The updates include comparative methods for improving reliability; methods for optimal allocation of limited resources to achieve a maximum risk reduction; methods for improving reliability at no extra cost and building reliability networks for engineering systems. Includes: A unique set of 46 generic principles for reducing technical risk Monte Carlo simulation algorithms for improving reliability and reducing risk Methods for setting reliability requirements based on the cost of failure New reliability measures based on a minimal separation of random events on a time interval Overstress reliability integral for determining the time to failure caused by overstress failure modes A powerful equation for determining the probability of failure controlled by defects in loaded components with complex shape Comparative methods for improving reliability which do not require reliability data Optimal allocation of limited resources to achieve a maximum risk reduction Improving system reliability based solely on a permutation of interchangeable components