Скачать книгу - Measurements in Spine Care

Полный вариант заголовка: «An account of a successful method of treating diseases of the spine : With observations, and cases in illustration / By Thomas Baynton».

A comprehensive guide to financial engineering that stresses real-world applications Financial engineering expert Charles S. Tapiero has his finger on the pulse of shifts coming to financial engineering and its applications. With an eye toward the future, he has crafted a comprehensive and accessible book for practitioners and students of Financial Engineering that emphasizes an intuitive approach to financial and quantitative foundations in financial and risk engineering. The book covers the theory from a practitioner perspective and applies it to a variety of real-world problems. Examines the cornerstone of the explosive growth in markets worldwide Presents important financial engineering techniques to price, hedge, and manage risks in general Author heads the largest financial engineering program in the world Author Charles Tapiero wrote the seminal work Risk and Financial Management.

In fluid mechanics, non-intrusive measurements are fundamental in order to improve knowledge of the behavior and main physical phenomena of flows in order to further validate codes. The principles and characteristics of the different techniques available in laser metrology are described in detail in this book. Velocity, temperature and concentration measurements by spectroscopic techniques based on light scattered by molecules are achieved by different techniques: laser-induced fluorescence, coherent anti-Stokes Raman scattering using lasers and parametric sources, and absorption spectroscopy by tunable laser diodes, which are generally better suited for high velocity flows. The size determination of particles by optical means, a technique mainly applied in two-phase flows, is the subject of another chapter, along with a description of the principles of light scattering. For each technique the basic principles are given, as well as optical devices and data processing. A final chapter reminds the reader of the main safety precautions to be taken when using powerful lasers.

This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure Offers a detailed explanation of algorithms and mathematics behind measurements and error correction Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.

A unique resource for process measurement Basic Process Measurements provides a unique resource explaining the industrial measuring devices that gauge such key variables as temperature, pressure, density, level, and flow. With an emphasis on the most commonly installed technologies, this guide outlines both the process variable being measured as well as how the relevant measuring instruments function. The benefits of each technology are considered in turn, along with their potential problems. Looking at both new and existing technologies, the book maintains a practical focus on properly selecting and deploying the best technology for a given process application. The coverage in Basic Process Measurements enables the practitioner to: Resolve problems with currently installed devices Upgrade currently installed devices to newer and better technologies Add instruments for process variables not previously measurable Evaluate device installations from a perspective of both normal process operating conditions and abnormal conditions Determine the best technology for a given set of process conditions Designed for a wide range of technical professionals, Basic Process Measurements provides a balanced treatment of the concepts, background information, and specific processes and technologies making up this critical aspect of process improvement and control.