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В справочнике приводится кодовая маркировка (SMD-коды) для 75800 активных электронных компонентов (диодов, тиристоров, биполярных и полевых транзисторов, интегральных микросхем). SMD-коды разделены по типам корпусов и расположены в таблицах в алфавитно-цифровом порядке. Даны, также, логотипы и адреса фирм-производителей электронных компонентов, схематические рисунки корпусов и назначение выводов (цоколевка) для дискретных полупроводниковых компонентов и большинства интегральных микросхем, типовые схемы подключения для большинства интегральных микросхем. Справочник предназначен для специалистов в области проектирования, наладки и ремонта бытовой и профессиональной аппаратуры, широкого круга радиолюбителей и радиоинженеров.

Your guide to keeping the heat on Whether you're an apprentice or a veteran HVAC technician, you know that technology changes and you need to keep up. This fully revised guidebook covers everything you need to know to install, maintain, and repair the components that run, regulate, and fuel both old and new systems. From oil burners and steam line controls to the newest chip-based technology and environmental regulations, Volume 2 helps you keep the heat on. * Install and repair thermostats, humidistats, automatic controls, and oil or gas burner controls * Review pipes, pipe fittings, piping details, valve installation, and duct systems * Find new calculations and environmental guidelines * Learn the best ways to handle hydronics and steam line controls * Deal with solid fuels and understand coal firing methods * Refer to data tables with conversions, formula cross-references, and manufacturers' lists The Audel HVAC Library Vol. 1: Heating Systems, Furnaces, and Boilers Vol. 2: Heating System Components, Gas and Oil Burners, and Automatic Controls Vol. 3: Air Conditioning, Heat Pumps, and Distribution Systems

More than just another business self-help book, The Equation is a groundbreaking formula that looks at how all business is an art. The book will help business people rethink how they manage their art form and help businesses accelerate their productivity by creating a corporate culture driven by passion and zeal, as art is. The book will help entrepreneurs rethink how they manage their art form and help businesses accelerate their productivity by transforming corporate culture to be driven by passion and zeal, as art is. The Equation (L/A*S=B) reveals a foolproof blueprint for business and life. Readers will learn that, first you have to love what you do (L) and become a highly-skilled artist at it (A), while developing promotional and marketing tools to gather public and professional support (S), which ultimately leads to big business (B).

In the spatial or spatio-temporal context, specifying the correct covariance function is fundamental to obtain efficient predictions, and to understand the underlying physical process of interest. This book focuses on covariance and variogram functions, their role in prediction, and appropriate choice of these functions in applications. Both recent and more established methods are illustrated to assess many common assumptions on these functions, such as, isotropy, separability, symmetry, and intrinsic correlation. After an extensive introduction to spatial methodology, the book details the effects of common covariance assumptions and addresses methods to assess the appropriateness of such assumptions for various data structures. Key features: An extensive introduction to spatial methodology including a survey of spatial covariance functions and their use in spatial prediction (kriging) is given. Explores methodology for assessing the appropriateness of assumptions on covariance functions in the spatial, spatio-temporal, multivariate spatial, and point pattern settings. Provides illustrations of all methods based on data and simulation experiments to demonstrate all methodology and guide to proper usage of all methods. Presents a brief survey of spatial and spatio-temporal models, highlighting the Gaussian case and the binary data setting, along with the different methodologies for estimation and model fitting for these two data structures. Discusses models that allow for anisotropic and nonseparable behaviour in covariance functions in the spatial, spatio-temporal and multivariate settings. Gives an introduction to point pattern models, including testing for randomness, and fitting regular and clustered point patterns. The importance and assessment of isotropy of point patterns is detailed. Statisticians, researchers, and data analysts working with spatial and space-time data will benefit from this book as well as will graduate students with a background in basic statistics following courses in engineering, quantitative ecology or atmospheric science.

With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.