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An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world's top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and microscope imaging. The resulting systematic collection of these advanced tools will benefit graduate students, postdocs as well as professional researchers.

A comprehensive, practical approach to three powerful methods of polymer analysis and characterization This book serves as a complete compendium of three important methods widely used for the characterization of synthetic and natural polymers—light scattering, size exclusion chromatography (SEC), and asymmetric flow field flow fractionation (A4F). Featuring numerous up-to-date examples of experimental results obtained by light scattering, SEC, and A4F measurements, Light Scattering, Size Exclusion Chromatography and Asymmetric Flow Field Flow Fractionation takes an all-in-one approach to deliver a complete and thorough explanation of the principles, theories, and instrumentation needed to characterize polymers from the viewpoint of their molar mass distribution, size, branching, and aggregation. This comprehensive resource: Is the only book gathering light scattering, size exclusion chromatography, and asymmetric flow field flow fractionation into a single text Systematically compares results of size exclusion chromatography with results of asymmetric flow field flow fractionation, and how these two methods complement each other Provides in-depth guidelines for reproducible and correct determination of molar mass and molecular size of polymers using SEC or A4F coupled with a multi-angle light scattering detector Offers a detailed overview of the methodology, detection, and characterization of polymer branching Light Scattering, Size Exclusion Chromatography and Asymmetric Flow Field Flow Fractionation should be of great interest to all those engaged in the polymer analysis and characterization in industrial and university research, as well as in manufacturing quality control laboratories. Both beginners and experienced can confidently rely on this volume to confirm their own understanding or to help interpret their results.

Scattering is a very powerful tool to study the structure of polymers. Written by highly regarded and respected scientists in the field, this book presents the latest developments in the field of scattering in a uniform, systematic manner. This volume arms readers with both theoretical and experimental aspects of the intended area, offering much simplified theoretical explanations on the physics of scattering. The authors provide discussion on applications of experimental techniques. Han and Akcasu begin with a traditional treatment of light scattering from plane waves, followed by consistent application of density (in both real and Fourier space) correlation functions in both space and time. The authors do not distinguish among light, X-ray, and neutron, excepting their scattering length, q-range, coherence and detection differences. Readers can therefore concentrate on exactly the scattering tools they need to use, while theoretical explanation on the physics of scattering can be made much more simplified and uniform. Presents the latest development in the field of scattering in a uniform, systematic manner Arms readers with both theoretical and experimental aspects Gives a much simpler theoretical explanation on the physics of scattering Demonstrates application of experimental techniques

This self-contained book gives fundamental knowledge about scattering and diffraction of electromagnetic waves and fills the gap between general electromagnetic theory courses and collections of engineering formulas. The book is a tutorial for advanced students learning the mathematics and physics of electromagnetic scattering and curious to know how engineering concepts and techniques relate to the foundations of electromagnetics

Electromagnetic wave scattering from random rough surfaces is an active, interdisciplinary area of research with myriad practical applications in fields such as optics, acoustics, geoscience and remote sensing. Focusing on the case of random rough surfaces, this book presents classical asymptotic models used to describe electromagnetic wave scattering. The authors begin by outlining the basic concepts relevant to the topic before moving on to look at the derivation of the scattered field under asymptotic models, based on the Kirchhoff-tangent plane, in order to calculate both the scattered field and the statistical average intensity. More elaborated asymptotic models are also described for dealing with specific cases, and numerical results are presented to illustrate these models. Comparisons with a reference numerical method are made to confirm and refine the theoretical validity domains. The final chapter derives the expressions of the scattering intensities of random rough surfaces under the asymptotic models. Its expressions are given for their incoherent contributions, from statistical calculations. These results are then compared with numerical computations using a Monte-Carlo process, as well as with experimental models, for sea surface backscattering. Contents 1. Electromagnetic Wave Scattering from Random Rough Surfaces: Basics. 2. Derivation of the Scattered Field under Asymptotic Models. 3. Derivation of the Normalized Radar Cross-Section under Asymptotic Models. APPENDIX 1. Far-Field Scattered Fields under the Method of Stationary Phase. APPENDIX 2. Calculation of the Scattering Coefficients under the GO for 3D Problems. About the Authors Nicolas Pinel worked as a Research Engineer at the IETR (Institut d’Electronique et de Telecommunications de Rennes) laboratory at Polytech Nantes (University of Nantes, France) before joining Alyotech Technologies in Rennes, France, in July 2013. His research interests are in the areas of radar and optical remote sensing, scattering and propagation. In particular, he works on asymptotic methods of electromagnetic wave scattering from random rough surfaces and layers. Christophe Bourlier works at the IETR (Institut d’Electronique et de Telecommunications de Rennes) laboratory at Polytech Nantes (University of Nantes, France) and is also a Researcher at the French National Center for Scientific Research (CNRS) on electromagnetic wave scattering from rough surfaces and objects for remote sensing applications and radar signatures. He is the author of more than 160 journal articles and conference papers.